Neuromorphic Audio Edge Intelligence
Shih-Chii Liu
Institute of Neuroinformatics, University of Zurich and ETH Zurich
Symposium X: AI & IC Manufacturing
Symposium X: AI & IC Manufacturing
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In-memory Computing and Dynamic Vision Sensors: Recipes for tinyML in Internet of Video Things
Arindam Basu
Hongkong City University
A Novel DES Encryption Circuit Based on RRAM XOR Gates
Haoxiong Bi
Zhejiang University
A physical based 2D Monte Carlo Model of MO-ECRAM Programming for Device Optimization
Haotong Zhu
Peking University
AI Empowers Semiconductor Yield Signoff Ecosystem - Reducing Cost and Increasing Efficiency for Manufacturing with a Diversified Supply Chain
Mark Lu
Semitronix Corporation
The Application of Virtual Manufacturing in IC Process Development
Yunlong Li
Zhejiang University
Depth-first convolution-neural-network pipeline for compute-in-memory architecture
Cimang Lu
Flash Billion
Progress of AI for EDA Algorithms
Yu Han
Empyrean Technology Co., Ltd
Novel Data Storage Technology for AI
Xiangshui Miao
Huazhong University of Science and Technology
Developing a Neuromorphic Computer: Practices and Challenges
Gang Pan
Zhejiang University
Heterogeneous integration of analog and digital computing-in-memory technologies
Shaodi Wang
WITMEM Co., Ltd
The Integration of AI Large Model & Neuromorphic Computing in Memory with High Speed Analog Ics
Hongjie Liu
Shenzhen Reexen Technology Co., Ltd.
Nonvolatile emerging memory devices for energy-efficient edge AI accelerators
Daniele Ielmini
Politecnico Di Milano
Snapdragon Platform for High Performance 5G Mobile SOC & AI/Computing Application Manufactured with 4nm EUV Fin-FET Technology and Beyond
Jun Yuan
Qualcomm
Large Scale VLSI Mask Optimization
Bei Yu
The Chinese University of Hong Kong
Universal Process Migration Solution of MAGICAL for Analog IC Layout Automation
Yufeng Wei
Fudan University
Deep Neural Network Proxy Modelling for IC Virtual Fabrication
Dong Ni
Zhejiang University
A SelectiveNet-based Method for Defect Classification in Semiconductor Manufacturing
Qian Jin
Zhejiang University
AI driven process control by machine learning based virtual metrology for high product mix manufacturing
Chunshan Du
Siemens EDA
Machine Learning Technologies for Semiconductor Manufacturing
LiFei Sun
Lam Research
Deep-Learning-Based Proxy Modeling for Microscopic Process of Plasma Etching
Shuhang Chen
Zhejiang University
Predicting Material Removal Rate in Chemical Mechanical Polishing (CMP) Using Explainable Machine Learning Methodsl
Jiahui Zuo
Zhejiang University
Research on the application of artificial intelligence in device compact model and technology – circuits co-optimization
Ye Lu
Fudan University
Vector Matrix Multiplication with Two-Dimensional Materials
Mario Lanza
KAUST
α-In2Se3/MoTe2 heterojunction for p-type junction field-effect transistors with ferroelectric memory characteristics
Tianjiao Zhang
Zhejiang University
Investigation of the Carrier Velocity in Short Channel Ge MOSFET with NiGe Metal Source/Drain
Jing Yan
Zhejiang University
A First-Principles Study on the Stable Phase in Yttrium-Doped HfO2
Xiaomin Xiao
Peking University
Tiny Neural Network Representing MOSFET Physical Effect Sub-model
Shuhan Wang
Peking University
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Metal-Oxide-Metal Capacitor Simulation and Modeling by Virtual Fabrication
Qingpeng Wang
Lam Research
APPLICATION OF ADVANCED PROCESS CONTROL FOR IC MANUFACTURING
Linglie Zeng
Ontoinnovation
PMOS leakage reduction through SiGe morphology & IMP profile fine tune
WenZhao Fu
Shanghai Huali Integrated Circuit Corporation
The Defect Formation and Reduction of 55NM Ultra-low Power (55ULP) BEOL Process
Qing Mao
Shanghai Huali microelectronics Corporation
CONVOLUTIONAL NEURAL NETWORK (CNN) BASED PROCESS WINDOW ANALYSISING FOR LITHOGRAPHY
Zeyang Chen
School of Micro-Nano Electronics, Zhejiang University
Structure Optimization of NOR Flash for Improving Cell Performance
Jiayu Ma
Shanghai Huali Integrated Circuit Corporation
Digitalization Solutions for Automated Material Handling Systems in Semiconductor Smart Factories
Ruiji Wang
Huaxin (Jiaxing) Intelligent Equipment Co., LTD
High-Performance of SOT-MRAM Based on Optimization of Integration Processes
Xiaofei FAN
Truth Memory Corporation
A method for predicting the film thickness of IC deposited films based on FCBF-CatBoost
Cai Yu
University of Science and Technology of China
High Performance Wafer Defect Classification Model Based on Feature Fusion and RGB SEM images
Zhongyu Shi
University of Science and Technology of China
DSA for Nickel Silicide Formation in Advanced Devices
Haifeng Zhu
Applied Materials
Model of Organic Ferroelectric Transistors for Neural Networks
Kairui Ding
"Nanjing University of Posts and Telecommunications "