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Symposium VII: Packaging and Assembly

Symposium VII: Packaging and Assembly

Virtual Conference Registration
  • Download Agenda
  • CSTIC 2022 Call for Papers

Opening Remarks

  • Oral Session

  • Poster Session

  • TSV and Hybrid Bonding Solutions for 3D Heterogeneous Integration Packaging Applying in next AI / HPC Era

    Albert Lan

    Applied Materials

    The Development of 3D IPDs on Glass Wafer

    Daquan Yu

    Xiamen University

    Innovative PVD Technology Solutions for Advanced Substrate, Backside Metal and EMI Shielding

    Jeff Turner

    Applied Materials

    Heterogeneous Integration Driving New Packaging Technologies

    Nirmalya Maity

    Applied Materials

    Next generation high performance, six-pack double side cooled IGBT power module for EV/HEV applications

    Yaqing Ma

    Jiangsu HHCK advanced materials Co., Ltd.

    Important Considerations of Selecting Wafer/Panel-level Die Pick & Place Tool For High Volume Manufacturing

    Percy Lam

    ASM Pacific Technology Ltd.

    ASHING PROCESS ON WARPAGE WAFER WITH LOW DAMAGE

    Zihan Dong

    NAURA, Beijing

    Conformal Coating Process Optimization for Limiting Bubbles Formation

    Rexel Macaraya

    Integrated Micro-Electronics Inc.

    Electrochemical Migration (ECM) Prevention in Gate to Source of MOSFETs of Insulated Metal Substrate PCB Assembly

    Rexel Macaraya

    Integrated Micro-Electronics Inc.

    First Pass Yield Gain Strategies during Tri-Temperature Automotive Package Test

    Jerry Broz

    International Test Solutions

    Research on the Thermal Reliability of Multi-unit PIM

    Juan Hu

    Huangshan University

    A Study Of Thermal Interface Materials With Different Thermal Conductivity For HFCBGA Package

    Feng Wang

    ZTE Corporation

  • A Micro Soldering Method to Improve Strength Between Bonding Pad and Wire

    Li He

    Microsystem & Terahertz Research Center, China Academy of Engineering Physics (CAEP)

    Effect of Bi content on the microstructure and mechanical properties of Cu/Sn-Bi/Cu solder joints after soldering and aging

    Mingliang Huang

    Dalian University of Technology

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