Power-Aware Testing for Low-Power VLSI Circuits
Xiaoqing Wen
Kyushu Institute of Technology
Xiaoqing Wen
Kyushu Institute of Technology
Huawei Li
ICT, CAS
Yanyan Chang
Advantest
Daniel Sun
Advantest
Steve Xie
Advantest
Tianyu Zhang
Advantest
Shi-Qiang He
Fujian Jinhua Integrated Circuit Co.,Ltd
Lois Liao
Wintech-nano
Xiang Li
Applied Materials
Zhuolun Wu
Sanechips Technology Co., Ltd.
Guihai Yan
ICT, CAS
Hanyan Chen
Advantest
Xin Song
Advantest
Roy Pinhassi
Nova Ltd
Shuai Wang
Sanechips Technology Co., Ltd.
Feilong Pan
Sanechips Technology Co., Ltd.
Jiaqi Zheng
Zhejiang University
Yi Jiang
Zhejiang University
Weiwei Ma
HLMC
Johnny Dai
Onto Innovation
Lingran Pan
Zhejiang University
Lei Feng
Infinitesima Ltd
Ilya Osherov
Nova Ltd
Chang Xu
Fujian Jinhua Integrated Circuit Co., Ltd.
Wei Li
National Institute of Metrology
Shijia Yan
Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.(XMC)
Xianghua Hu
HLMC
Fan Zhang
SMIC
Xu Yun
SMIC
Lei Li
SMIC
Ting Wan
HLMC
JiZhou Li
SMIC
Wen Ying
Semiconductor Manufacturing International Corporation(SMIC)
Jia Zhu
SMIC
Johnny Mu
ONTO Innovation
Jin Sui
Shanghaitech University
Junfeng Zhao
Northeastern University
Hongzhe Wang
Northeastern University
Wenxin Shi
Tsinghua University
Tiangang Zhao
Tsinghua University
Xiaofeng Liang
NXP semiconductor (China) Ltd.
Lvye Fang
SMIC
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